Scanning Electron Microscopy
(SEM)
SOPHISTICATED INSTRUMENT FACILITIES
SF
Scanning Electron Microscopy (SEM)
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.
Sample Requirement: Solid (100 mg), Liquid (200-500µl)
Sample Extraction & Purification: If extraction has to be done by us it will charged extra (Please Click here for the details of Extractions).
Report will contain: Images at magnifications suitable for analysis e
Cat. Test
SF211 Sample Preparation ₹ 500/sample
SF212 Imaging with SEM for sample ₹ 2000/sample
SF213 Interpretation of Image/Data Nil
Note: GST Charges extra on total Amount (as may be applicable)
SF10 High Pressure Liquid Chromatography (HPLC)
SF12 Gas Chromatography Mass Spectrometry (GC-MS)
SF13 Liquid Chromatography Mass Spectrometry (LC-MS)
SF14 High Performance Thin Layer Chromatography (HPTLC)
SF15 UV-Vis Double Beam Spectrophotometer (UV)
SF16 Fourier-Transform Infrared Spectroscopy (FTIR)
SF17 Atomic Absorption Spectroscopy (AAS)
SF18 Nuclear magnetic resonance spectroscopy (NMR)
SF21 Scanning Electron Microscopy (SEM)
SF22 Transmission Electron Microscopy (TEM)
SF25 Inductively Coupled Plasma Spectrometry (ICP)