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Scanning Electron Microscopy
(SEM)
SOPHISTICATED INSTRUMENT FACILITIES
SF
Scanning Electron Microscopy (SEM)
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.
Sample Requirement: Solid (100 mg), Liquid (200-500µl)
Sample Extraction & Purification: If extraction has to be done by us it will charged extra (Please Click here for the details of Extractions).
Report will contain: Images at magnifications suitable for analysis e
Cat. Test
SF211 Sample Preparation ₹ 500/sample
SF212 Imaging with SEM for sample ₹ 2000/sample
SF213 EDX ₹ 1500/sample
SF 214 SEM & EDX ₹ 3000/sample
Note: GST Charges extra on total Amount (as may be applicable)
SF10 High Pressure Liquid Chromatography (HPLC)
SF12 Gas Chromatography Mass Spectrometry (GC-MS)
SF13 Liquid Chromatography Mass Spectrometry (LC-MS)
SF14 High Performance Thin Layer Chromatography (HPTLC)
SF15 UV-Vis Double Beam Spectrophotometer (UV)
SF16 Fourier-Transform Infrared Spectroscopy (ATR-FTIR)
SF17 Atomic Absorption Spectroscopy (AAS)
SF18 Nuclear magnetic resonance spectroscopy (NMR)
SF21 Scanning Electron Microscopy (SEM)