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 Scanning Electron Microscopy  (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

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Sample Requirement: Solid (100 mg), Liquid (200-500µl)

Sample Extraction & Purification: If extraction has to be done by  us it will charged extra (Please Click here​ for the details of Extractions).

Report will contain: Images at magnifications suitable for analysis e

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Cat.        Test 

Note: GST Charges extra on total Amount (as may be applicable)